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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Muresan, M. Pitica, D. Chindris, G. |
| Copyright Year | 2006 |
| Description | Author affiliation: Tech. Univ. of Cluj-Napoca, Cluj-Napoca (Muresan, M.; Pitica, D.; Chindris, G.) |
| Abstract | Automated optical inspection (AOI) of assembled PCB's is one of the most widely spread non-destructive testing method used in mass-production of electronic systems. Fast video processing algorithms and precise mechanical systems are supporting this cost-effective method for investigating electronics assemblies. However, for small production quantities, or for often changes in production line, the AOI bottleneck resides in the effort needed for adapting the pattern recognition files and component locations for each new board. The paper will present an effective method for importing assembly and technology files directly from the CAD environment and generating proper configuration files for the AOI system. The proposed linking tool will not only have the advantage of reducing time-to-test parameter, but will also increase the accuracy of the AOI process by providing test setups directly from CAD files of the device-under-test board (Prasad, 2002). |
| Starting Page | 304 |
| Ending Page | 308 |
| File Size | 586531 |
| Page Count | 5 |
| File Format | |
| ISBN | 1424405505 |
| DOI | 10.1109/ISSE.2006.365118 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2006-05-10 |
| Publisher Place | Germany |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Automatic optical inspection Assembly systems Production Electronic equipment testing Automatic testing Nondestructive testing System testing Mechanical systems Pattern recognition Paper technology |
| Content Type | Text |
| Resource Type | Article |
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