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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Oberhauser, K. Nemecek, A. Zimmermann, H. |
| Copyright Year | 2006 |
| Description | Author affiliation: Inst. of Electr. Measurements & Circuit Design, Vienna Univ. of Technol. (Oberhauser, K.; Nemecek, A.; Zimmermann, H.) |
| Abstract | The presented distance measurement sensor operates on a time-of-flight principle for distance determination. Electro-optical correlation of the reflected, low intensity optical input signal with the modulation signal is performed directly by the double-anode photodetector. The linearity error over the entire measurement range of 0.1-15 m is less than plusmn0.25%. The maximum standard deviation for a measurement time of 5 ms is 3.5 cm. The sensor implemented as a system on chip, containing the photodetector and the readout circuit, was fabricated in a modified 0.6 mum BiCMOS process. The active die area of the circuitry is 170times300 $mum^{2}.$ The area of the photodetector is 100times100 $mum^{2}$ |
| Sponsorship | IEEE Region 8 IEEE Spain Sect |
| Starting Page | 377 |
| Ending Page | 380 |
| File Size | 472104 |
| Page Count | 4 |
| File Format | |
| ISBN | 1424400872 |
| DOI | 10.1109/MELCON.2006.1653117 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2006-05-16 |
| Publisher Place | Spain |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Distance measurement Photodetectors Semiconductor device measurement Optical modulation Optical sensors Electrooptic modulators Intensity modulation Linearity Integrated circuit measurements Measurement standards |
| Content Type | Text |
| Resource Type | Article |
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