NDLI: A VLSI multiple input/Output ISL gate demonstrated in a 1.25µm oxide-isolated bipolar process

Content Provider	IEEE Xplore Digital Library
Author	Vu, T. Roberts, P. Lamb, D. Belt, R. Bostick, D. Zafar, N. Lee, G. Joseph, J. Prestholdt, D. Pai, S. Burbank, D. Vyas, H. Nielsen, D.
Copyright Year	1982
Description	Author affiliation: Honeywell Systems and Research Center, Minneapolis, Minnesota (Vu, T.)
Abstract	An improved ISL gate structure has been characterized which offers multiple inputs and outputs for high performance VLSI. The gate features remote Schottky diodes to eliminate current hogging and to perform front-end logic functions, and provides on-gate vertical and horizontal routing channels. A current level of 20µA (25°-C) was chosen for the optimum speed versus power trade-off over the full military ambient temperature range (-55°C to 125°C). Scaling the gate current from 100µA down to 20µA results in the following advantages: a) very little degradation of logic swing voltage versus fanout at different temperatures, b) no need to modify the substrate pnp transistor's collector resistance to avoid saturation. Measurements of gate delay and logic swing at this 20µA current show 1.2ns and 240mv respectively at room temperature for a speed power product of 36fJ. The gate consumes an area of 18.8µm × 92.8µm (=2.7 $mils^{2})$ and provides 3 vertical × 14 horizontal tracks for connection. The 30µw gate demonstrates a figure-of-merit of 40K $gates/cm^{2}×$ 33MHz = 1.3 × $10^{12}gate-Hz/cm^{2}and$ has also been operated at 22.5µw (15µA) without requiring modifications to our standard 1.25µm oxide isolated process.
Starting Page	680
Ending Page	683
File Size	1136497
Page Count	4
File Format	PDF
DOI	10.1109/IEDM.1982.190385
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1982-12-13
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Very large scale integration Schottky diodes Logic functions Routing Temperature distribution Degradation Voltage Current measurement Electrical resistance measurement Power measurement
Content Type	Text
Resource Type	Article

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