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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Adler, M.S. Beatty, B.A. Krishna, S. Temple, V.A.K. Torreno, M.L. |
| Copyright Year | 1975 |
| Description | Author affiliation: General Electric Co., Schenectady, New York (Adler, M.S.) |
| Abstract | In this paper the mechanisms of bandgap narrowing, Shockly-Read-Hall (SRH) recombination, Auger recombination, and carrier-carrier and carrier-lattice scattering are included in an exact one-dimensional model of a bipolar transistor. The transistor is used as a vehicle for studying the relative importance of each of these phenomena in determining emitter efficiency in devices with emitter junction depths of 1µm to 8µm. It is shown that band gap narrowing is the dominant influence for devices with shallow emitters of 2µm or less and that SRH recombination dominates for emitter depths greater than 4µm. Calculations are also presented showing the effects of the emitter surface concentration and high level injection on the current gain for devices with emitter junction depths of 1 µm to 8µm. It is shown that there is an optimum surface concentration $of5\times10^\{19\}cm^{-3}for$ the 1µm emitter depth but no optimum under $10^{21}cm^{-3}for$ devices with emitter depths greater than 4µm. |
| Starting Page | 175 |
| Ending Page | 179 |
| File Size | 403306 |
| Page Count | 5 |
| File Format | |
| DOI | 10.1109/IEDM.1975.188853 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1975-12-01 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Photonic band gap Bipolar transistors Equations Scattering Vehicles Rectifiers Thyristors Charge carrier lifetime Context modeling Power transistors |
| Content Type | Text |
| Resource Type | Article |
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