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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Connor, S. Archambeault, B. Diepenbrock, J.C. |
| Copyright Year | 2008 |
| Description | Author affiliation: IBM Corp., Research Triangle Park, NC (Connor, S.; Archambeault, B.; Diepenbrock, J.C.) |
| Abstract | As voltage levels decrease and data rates increase and the electromagnetic environment becomes more noisy for high-speed, differential, I/O data buses in data centers, the electromagnetic susceptibility of these data links increases. Signal integrity and EMC engineers need a way to quantify the risk of data errors given a certain level of external noise and an I/O cablepsilas characteristics. This paper proposes a methodology by which an engineer can calculate a transfer function that enables one to determine the differential noise signal created by an external field or conversely to determine the external field strength necessary to create a differential signal capable of causing data errors. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 426643 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424416998 |
| DOI | 10.1109/ISEMC.2008.4652160 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-08-18 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Transfer functions Signal analysis Noise Electric fields Scattering parameters Radio frequency Data buses eye diagram Differential data buses electromagnetic interference immunity common mode |
| Content Type | Text |
| Resource Type | Article |
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