NDLI: Enhanced skin effect for partial element equivalent circuit (PEEC) models

Content Provider	IEEE Xplore Digital Library
Author	Coperich, K.M. Ruehli, A.E. Cangellaris, A.
Copyright Year	1999
Description	Author affiliation: Illinois Univ., Urbana, IL, USA (Coperich, K.M.)
Abstract	A convenient skin effect model for the partial element equivalent circuits (PEEC) technique is the so-called volume filament technique. This approach is an integral part of the basic PEEC model if the conductor cross-sections are subdivided into cells. This model is efficient for geometries and frequencies where the skin depth is moderate compared to the conductor thickness. However, the computational cost may be too high for the case where the skin depth is a small fraction of the cross-section, especially if it is subdivided into uniform cells. In this paper, a model is presented that is suitable for all frequency regimes of interest, and thus is most appropriate for transient interconnect analysis using a full-wave model denoted as (Lp, P, Z/sub s/, /spl tau/)PEEC, to indicate the inclusion of the complex skin effect model Z/sub s/.
Starting Page	189
Ending Page	192
File Size	293803
Page Count	4
File Format	PDF
ISBN	0780355970
DOI	10.1109/EPEP.1999.819223
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1999-10-25
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Skin effect Equivalent circuits Frequency Conductors Power system transients Transient analysis Electronics packaging Current distribution Current density Solid modeling
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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