NDLI: Impact of corrosive environment on contact resistance of infrequently mated connectors

Content Provider	IEEE Xplore Digital Library
Author	Meyyappan, K. McAllister, A. Vasudevan, V. Kurella, A. Pathangey, B. Soni, S.
Copyright Year	2015
Description	Author affiliation: Data Center Group, Intel Corp., DuPont, WA, USA (Meyyappan, K.) \|\| Technol. Manuf. Group, Intel Corp., Hillsboro, OR, USA (McAllister, A.; Vasudevan, V.; Kurella, A.; Pathangey, B.; Soni, S.)
Abstract	Separable connectors are commonly plated with gold for optimum electrical properties. In aggressive environments, gold provides adequate resistance for corrosion of underneath copper. Corrosion resistance has been historically studied by exposing the connectors to a mixture of corrosive gases through a mixed flowing gas (MFG) test. A few studies in the past claimed that contact electrical resistance can stay stable even in unplated samples if micromotion between the interfaces can be eliminated. However, contact force relaxation and micromotion can disturb the mating interface resulting in resistance increases. To understand the interactions between surface finish plating, end usage and micromotion under an aggressive environment, a DOE was planned with linear edge connectors in a MFG chamber. The effect of end usage was addressed through mated and unmated connector samples followed by electrical testing. The impact of mechanical force was studied by controlling the micromotion through a custom vibration fixture that was designed to operate within the MFG chamber. Results from our studies are expected to initiate efforts towards improving existing industry test standards with recommendation to consider the effects of mechanical retention and end usage in addition to plating material and thickness.
Starting Page	317
Ending Page	323
File Size	3661890
Page Count	7
File Format	PDF
e-ISBN	9781467393416
DOI	10.1109/HOLM.2015.7355115
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-10-11
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Connectors Corrosion Gold Contacts Resistance Vibrations Nickel Plating Micromotion component MFG Creep Corrosion Connector Contact Resistance
Content Type	Text
Resource Type	Article

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