NDLI: Effect of fretting wear damage in RF connectors subjected to vibration: DC contact resistance and phase-noise response

Content Provider	IEEE Xplore Digital Library
Author	Enquebecq, R. Fouvry, S. Rubiola, E. Collet, M. Petit, L. Legrand, J. Boillot, L.
Copyright Year	2015
Description	Author affiliation: TF Dept., Femto-ST, Besancon, France (Rubiola, E.) \|\| LTDS, Ecole Centrale de Lyon, Lyon, France (Enquebecq, R.; Fouvry, S.; Collet, M.) \|\| Radiall, Voreppe, France (Petit, L.; Legrand, J.; Boillot, L.)
Abstract	In many applications, RF connectors are subjected to severe environmental vibration. Vibration induces micro-displacements, leading to fretting wear damage in the contact. The purpose of this study is to investigate the effect of fretting wear on the microwave signal and more precisely on the additive phase noise [1, 2]. A dedicated vibration test was developed, combining DC and microwave measurement. It consisted of a shaker, a vector network analyzer, a phase-noise analyzer using a cross-correlation technique, and a system for measuring electrical contact resistance. Degradation of phase noise by fretting wear was demonstrated. Two contributions were identified: relative fretting displacement amplitude, by fluctuating the total transmission distance, induced phase noise at the specific fretting frequency proportional to the fretting displacement; also, by inducing oxide debris in the interface, gross slip fretting wear damage decayed DC electrical contact resistance and microwave signal transmission. The study established quantitative correlations between the evolution of DC, transmission loss and phase-noise parameters.
Starting Page	22
Ending Page	28
File Size	515369
Page Count	7
File Format	PDF
e-ISBN	9781467393416
DOI	10.1109/HOLM.2015.7354950
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-10-11
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Connectors Vibrations Contacts Electrical resistance measurement Phase noise Resistance Microwave measurement
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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