NDLI: Late breakdown phenomena in vacuum interrupters

Content Provider	IEEE Xplore Digital Library
Author	Schlaug, M. Dalmazio, L. Ernst, U. Godechot, X. Kantas, S. Triaire, C.
Copyright Year	2008
Description	Author affiliation: AREVA T&D Distrib. R&D Center, Montpellier (Schlaug, M.; Dalmazio, L.; Ernst, U.; Godechot, X.; Kantas, S.; Triaire, C.)
Abstract	Late breakdown (LBD) phenomena in vacuum interrupters are being discussed for more than 20 years. This has led to several changes and amendments to the major international standards in the past ten years and thus to clear rules for the interpretation of these phenomena during type testing. The physical nature, however, is still being discussed with two schools of thoughts being pursued. One model is based on field electron emission effects whereas the other concept calls for particle induced breakdowns. This paper aims to widen the understanding of late breakdowns by correlating experimental results of a low-energy in-house test circuit with those obtained at high power test stations. The emphasis of the experimental work is put on the influence of dielectric performance, contact materials and micro-particles on the late breakdown behavior of the interrupters. The two explanation models will be discussed and guidelines on how to improve the design and performance of vacuum interrupters presented.
Starting Page	247
Ending Page	250
File Size	162565
Page Count	4
File Format	PDF
ISBN	9789737553829
ISSN	10932941
DOI	10.1109/DEIV.2008.4676766
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-09-15
Publisher Place	Romania
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Vacuum breakdown Interrupters Circuit testing Electric breakdown Circuit breakers Electron emission Performance evaluation Voltage IEC standards Educational institutions
Content Type	Text
Resource Type	Article
Subject	Computer Networks and Communications Software

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