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Content Provider | IEEE Xplore Digital Library |
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Author | Xiaoxiao Liu Yong Li Yaojun Zhang Jones, A.K. Yiran Chen |
Copyright Year | 2014 |
Description | Author affiliation: Dept. of Electr. & Comput. Eng., Univ. of Pittsburgh, Pittsburgh, PA, USA (Xiaoxiao Liu; Yong Li; Yaojun Zhang; Jones, A.K.; Yiran Chen) |
Abstract | Translation lookaside buffer (TLB) was recently introduced into modern graphics processing unit (GPU) architectures to support virtual memory addressing. Compared to CPUs, the performance of GPUs is more sensitive to the capacity of TLBs because of heavier memory accesses. However, large SRAM cell area greatly limits the implementable capacity of conventional SRAM-based TLBs. In this work, we propose using STT-RAM to construct TLBs in light of the unique memory access pattern in GPUs, i.e., infrequent data updates. STT-RAM TLB can replace its same-area SRAM counterpart with greater capacity, similar read performance and lower energy consumption. As an optimization of STT-RAM TLB, we further propose a STT-RAM-based dynamically-configurable TLB (STD-TLB) by leveraging differential sensing technique. STD-TLB can switch between high-capacity mode and high-performance mode on-the-fly based on real-time application needs. Our experiments show that compared to SRAM TLB, standard STT-RAM TLB improves the performance and energy delay product of GPU address translation by 32% and 75%, respectively, while STD-TLB achieves additional 15% and 13% improvements over standard STT-RAM TLB. |
Sponsorship | IEEE Circuits Syst. Soc. |
Starting Page | 355 |
Ending Page | 360 |
File Size | 952625 |
Page Count | 6 |
File Format | |
ISBN | 9781479928163 |
DOI | 10.1109/ASPDAC.2014.6742915 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2014-01-20 |
Publisher Place | Singapore |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Random access memory Graphics processing units Computer architecture Standards Microprocessors Sensors Benchmark testing |
Content Type | Text |
Resource Type | Article |
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