NDLI: On the testing quality of random and pseudo-random sequences for permanent and intermittent faults

Content Provider	IEEE Xplore Digital Library
Author	Jin Ding Yu-Liang Wu
Copyright Year	1999
Description	Author affiliation: Dept. of Telecommun., Beijing Univ. of Posts & Telecommun., China (Jin Ding)
Abstract	In this paper, the natures of random and pseudo-random input sequences and their influence on permanent and intermittent fault detecting are analyzed. The aliasing fault coverage between the pseudo-random and random sequences is estimated. The activity probability features of the intermittent faults are considered. The self-test circuits of the intermittent faults are illustrated. The experimental results based on real circuits are obtained through simulation. The mathematical analysis and experimental results show that the quality of the pseudo-random testing is better than that of the random testing for permanent and intermittent faults. The Markov chain models are used in obtaining the input sequence length needed for determining if a circuit fault is intermittent or permanent.
Starting Page	311
Ending Page	314
File Size	436172
Page Count	4
File Format	PDF
ISBN	078035012X
DOI	10.1109/ASPDAC.1999.760021
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1999-01-21
Publisher Place	Hong Kong
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit faults Circuit testing Built-in self-test Random sequences Very large scale integration Telecommunications Electrical fault detection Automatic testing Circuit simulation Mathematical analysis
Content Type	Text
Resource Type	Article

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