NDLI: Architecture-Level Soft Error Analysis: Examining the Limits of Common Assumptions

Content Provider	IEEE Xplore Digital Library
Author	Xiaodong Li Adve, S.V. Bose, P. Rivers, J.A.
Copyright Year	2007
Description	Author affiliation: Univ. of Illinois at Urbana-Champaign, Urbana-Champaign (Xiaodong Li; Adve, S.V.)
Abstract	This paper concerns the validity of a widely used method for estimating the architecture-level mean time to failure (MTTF) due to soft errors. The method first calculates the failure rate for an architecture-level component as the product of its raw error rate and an architecture vulnerability factor (AVF). Next, the method calculates the system failure rate as the sum of the failure rates (SOFR) of all components, and the system MTTF as the reciprocal of this failure rate. Both steps make significant assumptions. We investigate the validity of the AVF+SOFR method across a large design space, using both mathematical and experimental techniques with real program traces from SPEC 2000 benchmarks and synthesized traces to simulate longer real-world workloads. We show that AVF+SOFR is valid for most of the realistic cases under current raw error rates. However, for some realistic combinations of large systems, long-running workloads with large phases, and/or large raw error rates, the MTTF calculated using AVF+SOFR shows significant-discrepancies from that using first principles. We also show that SoftArch, a previously proposed alternative method that does not make the AVF+SOFR assumptions, does not exhibit the above discrepancies.
Starting Page	266
Ending Page	275
File Size	465776
Page Count	10
File Format	PDF
ISBN	0769528554
DOI	10.1109/DSN.2007.15
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-06-25
Publisher Place	UK
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Error analysis Rivers Computer science Computer errors Single event upset Neutrons Cosmic rays Alpha particles Integrated circuit packaging Logic devices
Content Type	Text
Resource Type	Article

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