NDLI: Improving X-tolerant combinational output compaction via input rotation

Content Provider	IEEE Xplore Digital Library
Author	Bawa, A.A. Touba, N.A.
Copyright Year	2015
Description	Author affiliation: Comput. Eng. Res. Center, Univ. of Texas, Austin, TX, USA (Bawa, A.A.; Touba, N.A.)
Abstract	Combinational linear compactors can be used to compact the output response for a large number of scan chains into a smaller number of outputs. While some compactor designs can guarantee observation of all scan chains in the presence of a small number of X's, this may not be sufficient for designs with higher X densities. This paper describes an approach for using a combinational rotator between the scan chains and compactor to allow detection of faults even in the presence of high X densities. It is shown that the number of control inputs to the rotator is comparable to the number of control inputs required by conventional X masking approaches, but by not masking, the proposed approach is able to provide higher observability which translates to fewer test patterns, better compression, and better coverage of non-modeled faults. Moreover, the control data for the rotator has many more don't cares than the control data for X masking thereby making it easier and more efficient to compress with a linear decompressor. A heuristic procedure for ordering the inputs to a combinational compactor to increase the probability of observation for a given maximum shift distance is also presented. Experimental results indicate that high observability can be achieved using the proposed method with a relatively small number of control inputs.
Starting Page	167
Ending Page	170
File Size	144708
Page Count	4
File Format	PDF
e-ISBN	9781479986064
DOI	10.1109/DFT.2015.7315156
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-10-12
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Observability Very large scale integration Fans Compaction Design automation Circuit faults Discrete Fourier transforms
Content Type	Text
Resource Type	Article

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