NDLI: Using partial masking in X-chains to increase output compaction for an X-canceling MISR

Content Provider	IEEE Xplore Digital Library
Author	Bawa, A.A. Rab, M.T. Touba, N.A.
Copyright Year	2012
Description	Author affiliation: Computer Engineering Research Center, Department of Electrical and Computer Engineering, University of Texas, Austin, TX 78712-1084 (Bawa, A.A.; Rab, M.T.; Touba, N.A.)
Abstract	An X-Canceling MISR [Touba 07] provides the ability to tolerate unknowns (X's) in the output response with very little loss of observability of non-X values. When the density of X's is low, an X-Canceling MISR is extremely efficient as the number of control bits depends only on the total number of X's in the output response. However, for higher X-densities, an X-Canceling MISR becomes less efficient. This paper describes a very effective approach for using an X-Canceling MISR for designs with high X-density. It utilizes the idea of stitching together scan cells that capture the largest number of X's into "X-chains" as was proposed in [Wohl 08]: In the proposed approach, a partial X-masking approach is used for the X-chains to eliminate the vast majority of the X's at very little cost in terms of control bits. Only the X's coming from the scan cells not in the X-chains plus X's that are left unmasked in the X-chains need to be handled by the X-canceling MISR thereby significantly reducing the total number of control bits required. Experimental results show an order of magnitude improvement in the output compaction can be achieved.
Starting Page	19
Ending Page	24
File Size	756835
Page Count	6
File Format	PDF
ISBN	9781467330435
e-ISBN	9781467330442
DOI	10.1109/DFT.2012.6378193
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-10-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault tolerance Fault tolerant systems Very large scale integration Nanotechnology Discrete Fourier transforms X-chains output compression output masking
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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