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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Trzaska, M. Trzaska, Z.W. |
| Copyright Year | 2008 |
| Description | Author affiliation: Fac. of Mater. Sci. & Eng., Warsaw Univ. of Technol., Warsaw (Trzaska, M.; Trzaska, Z.W.) |
| Abstract | In this paper, electrodeposition of nano- and micro-crystalline copper films and thin-layers with direct and pulse periodic currents is effectively controlled. Electrical and physico-chemical characterizations of the copper films are realized, and the optimized electrodeposition parameters are so determined. Next, they are applied to micromolding. The attention is focused on microstructure, surface roughness, hardness, and on process parameters leading to major differences in final products. The obtained results show that the addition of a spike and a decrease in forward current can improve the throwing power in plating quality. Decrease in the grains dimension of the copper layers results in an increase of both the corrosion rate and the double layer capacitance but then charge transfer resistance decreases. |
| Starting Page | 2196 |
| Ending Page | 2201 |
| File Size | 305339 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781424420780 |
| ISSN | 07431619 |
| DOI | 10.1109/ACC.2008.4586818 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-06-11 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | American Automatic Control Council(AACC) |
| Subject Keyword | Copper Nanostructured materials Integrated circuit interconnections Atomic force microscopy Scanning electron microscopy Corrosion Transmission electron microscopy Electric resistance Semiconductor materials Computer aided manufacturing |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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