NDLI: A class of fault-tolerant cellular permutation networks

Content Provider	IEEE Xplore Digital Library
Author	Eleuldj, M. Aboulhamid, E.M. Cerny, E.
Copyright Year	1988
Description	Author affiliation: Dept. d'Inf. et de Recherche Oper., Montreal Univ., Que., Canada (Eleuldj, M.; Aboulhamid, E.M.; Cerny, E.)
Abstract	A scheme for fault-tolerant triangular cellular interconnection networks is proposed. A fault model is defined which unifies the concept of usable and unusable faulty components. An algorithm for testing these networks with a minimal number of tests (8) is presented. This result is extended to other cellular networks. A constant number of tests independent of the network size (at most 8) is added, in order to locate the faulty cell in the triangular cellular interconnection networks. Then, by considering networks of n+2 instead of n inputs/outputs, any single faulty cell can be tolerated. Neither the complexity of the cell nor that of the links is increased. The programming of the fault tolerant network is of the same complexity as that of the fault-free network and the relative silicon area overhead decreases with n and is proportional to 4/n.<>
Starting Page	136
Ending Page	139
File Size	317824
Page Count	4
File Format	PDF
ISBN	0818608722
DOI	10.1109/ICCD.1988.25677
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1988-10-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault tolerance Cellular networks Testing Multiprocessor interconnection networks Land mobile radio cellular systems Silicon Fault diagnosis Multiprocessing systems Telecommunication switching Communication switching
Content Type	Text
Resource Type	Article

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