NDLI: Modified Geffe Test Pattern Generator for Built-in Self-test

Content Provider	IEEE Xplore Digital Library
Author	Dandan Qi Muzio, J.C.
Copyright Year	2007
Description	Author affiliation: Univ. of Victoria, Victoria (Dandan Qi; Muzio, J.C.)
Abstract	Various linear finite state machines have been widely used as pseudo-random test pattern generators for Built-in Self-test. These generators are inexpensive to use as they have the advantage of low hardware overhead. However, the Geffe generator, a classic type of nonlinear finite state machines, hasn't been frequently studied or used in similar applications. It is known that a Geffe generator when used as a pattern generator for digital system testing gives improved fault detection. Unfortunately, the area overhead involved is sufficiently high, thus such a generator becomes impractical for Built-in Self-test design. We propose a possible redesign of the Geffe generator. This redesign has very sharply reduced area overhead. More importantly, the fault simulation results show it can lead to fault coverage, which is comparable to the original Geffe generator.
Starting Page	210
Ending Page	213
File Size	156375
Page Count	4
File Format	PDF
ISBN	9781424411894
DOI	10.1109/PACRIM.2007.4313213
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-08-22
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Test pattern generators Built-in self-test Circuit testing Circuit faults Automata Hardware Sequential circuits Automatic testing Computer science Fault detection
Content Type	Text
Resource Type	Article

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