NDLI: On-chip iDD pulse response method using a high-speed dynamic current sensor

Content Provider	IEEE Xplore Digital Library
Author	Aceved, G.O.D. Ramirez-Angulo, J.
Copyright Year	2002
Description	Author affiliation: Klipsch Sch. of Electr. & Comput. Eng., New Mexico State Univ., Las Cruces, NM, USA (Aceved, G.O.D.; Ramirez-Angulo, J.)
Abstract	This paper presents design considerations for a high-speed dynamic current sensor for iDD analysis. This testing scheme, known as the iDD pulse response method is a built-in scheme for analog, digital and mixed-signal circuitry compatible with the IEEE 1149.4 mixed-signal test bus standard. A high-speed dynamic current sensor is required for this method and is described in this paper. Simulation results are provided for the current sensor used to observe the iDD supply current of analog and digital devices. Simulation results include iDD waveforms of defect-free circuits, for circuits with parametric/global faults, and circuits with catastrophic faults. This testing technique serves as an early screening method for defect-free circuits and will potentially allow a fault-free IC to enter the market in significantly less time.
Sponsorship	IEEE Circuits & Syst. Soc. School of Electr. & Comput. Eng. at Oklahoma State Univ
File Size	257040
File Format	PDF
ISBN	0780375238
DOI	10.1109/MWSCAS.2002.1186853
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2002-08-04
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Circuit faults Pulsed power supplies Current supplies Pulse measurements Analog circuits Pulse circuits Circuit simulation Voltage Design engineering
Content Type	Text
Resource Type	Article

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