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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Chakrabarti, S. Chatterjee, A. |
| Copyright Year | 1999 |
| Description | Author affiliation: Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA (Chakrabarti, S.) |
| Abstract | Expensive specification testing of analog and mixed-signal circuits is currently being replaced by fault-oriented test techniques, similar to the ones used for digital circuits. However, the large number of possible failure modes in analog and mixed-signal circuits presents a major bottleneck in terms of fault simulation complexity and size of fault dictionary. For a given set of possible faults, it has been shown that only a small fraction of the total number of faults contribute to diagnostic accuracy. In this paper, we present a fault sampling methodology that identifies those faults by simulating only a minimal fraction of the entire set of possible faults. The proposed sampling algorithm is based on statistical fault simulation and leads to major reductions in fault simulation complexity for hierarchical analog and mixed-signal circuits. |
| Starting Page | 444 |
| Ending Page | 447 |
| File Size | 415984 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780354710 |
| DOI | 10.1109/ISCAS.1999.780761 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1999-05-30 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Circuit faults Sampling methods Circuit testing Circuit simulation Dictionaries Fault diagnosis Design automation System testing Isolation technology Digital circuits |
| Content Type | Text |
| Resource Type | Article |
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