NDLI: Role of BIT in support system maintenance and availability

Content Provider	IEEE Xplore Digital Library
Author	Drees, R. Young, N.
Copyright Year	2003
Description	Author affiliation: Mission Solutions, BAE SYSTEMS, San Diego, CA, USA (Drees, R.; Young, N.)
Abstract	The role of built in test (BIT) in electronic systems has grown in prominence with the advances in system complexity and concern over maintenance lifecycle costs of large systems. In an environment where standards drive system designs (and provide an avenue for focused advancement in technology), standards for BIT are very much in an evolutionary state. The reasons for advancing the effectiveness of BIT include reduced support overhead, greater confidence in operation, and increased system availability. The cost of supporting military electronic systems (avionics, communications and weapons) has driven much of the development in BIT technology. But what about the systems that support these end items that contain test and measurement instrumentation-such as automatic test equipment (ATE), simulators and avionics development suites? There has also been a beneficial effect on the maintenance and availability of these systems due to the infusion of BIT into their component assemblies. But the effect has been much more sporadic and fragmented. This paper looks at the state of BIT in test and measurement instruments, explains its affect on system readiness, and presents ideas on how to improve BIT technologies and standards. This paper does not provide definitive answers to BIT development questions, since the factors that affect it are specific to the instrument itself.
Sponsorship	IEEE Aerosp. & Electron. Syst. Soc. IEEE Instrumentation & Meas. Soc. IEEE LEOS Angeles Council IEEE Orange County Sect
Starting Page	482
Ending Page	485
File Size	355101
Page Count	4
File Format	PDF
ISBN	0780378377
ISSN	10807725
DOI	10.1109/AUTEST.2003.1243619
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-09-22
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	System testing Instruments Costs Aerospace electronics Electronic equipment testing Life testing Military communication Weapons Automatic testing Automatic test equipment
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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