NDLI: C-17 - successful deployment of commercial ATE to an Air Force I-level (back-shop) repair facility

Content Provider	IEEE Xplore Digital Library
Author	Sidhwa, F. Moore, F. Williams, T. Matsuura, D.
Copyright Year	2003
Description	Author affiliation: USAF Airlift & Transp. Programs, The Boeing Co, Long Beach, CA, USA (Sidhwa, F.; Moore, F.)
Abstract	In today's world of constrained military budgets, one of the problems the Military faces is the challenge of trying to maintain organic maintenance capabilities. Historically the US Air Force has desired to achieve an autonomous capability to maintain the equipment it uses. This has been achieved traditionally by setting-up 3 levels of maintenance; organizational, intermediate (back-shop) and depot. The I-level back-shops often utilize militarized automatic test equipment (ATE) and test program sets (TPSs) to test today's complex aircraft line replaceable units (LRUs) And even though this is still a cost effective maintenance philosophy, it has become very costly to develop militarized ATE. The DoD (Department of Defense) has been very active in trying to reduce the total ownership cost of ATE in the government inventory. One approach is to utilize commercial, instead of Mil-Spec, ATE. However, utilizing commercial ATE at an USAF back-shop is not without its tradeoffs and challenges as it represents a significant deviation from the way the USAF maintenance squadrons are accustomed to "doing business". This paper documents a current success story of replacing the legacy C-17 I-level ATE with a commercial ATE.
Sponsorship	IEEE Aerosp. & Electron. Syst. Soc. IEEE Instrumentation & Meas. Soc. IEEE LEOS Angeles Council IEEE Orange County Sect
Starting Page	148
Ending Page	153
File Size	571501
Page Count	6
File Format	PDF
ISBN	0780378377
ISSN	10807725
DOI	10.1109/AUTEST.2003.1243570
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-09-22
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Automatic testing Military equipment Automatic test equipment Costs Documentation Military aircraft Aging Interference Weapons Procurement
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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Successful deployment of commercial ATE to an Air Force I-level (back-shop) repair facility

C-17 automatic test system operations versatile automated test equipment

The emergence of Air Force Material Command and automatic test equipment (ATE) acquisition

Rehosting legacy test program sets from military ATE

Factors influencing the acquisition of low cost deployable automatic test equipment-LCDATE

C-17, successful application of existing automatic test equipment

Using integrated diagnostics on automatic test equipment

Air force effort to improve management of ate software development

Rehosting legacy test program sets from military ATE

C-17 - successful deployment of commercial ATE to an Air Force I-level (back-shop) repair facility

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Successful deployment of commercial ATE to an Air Force I-level (back-shop) repair facility

C-17 automatic test system operations versatile automated test equipment

The emergence of Air Force Material Command and automatic test equipment (ATE) acquisition

Rehosting legacy test program sets from military ATE

Factors influencing the acquisition of low cost deployable automatic test equipment-LCDATE

C-17, successful application of existing automatic test equipment

Using integrated diagnostics on automatic test equipment

Air force effort to improve management of ate software development

Rehosting legacy test program sets from military ATE

C-17 - successful deployment of commercial ATE to an Air Force I-level (back-shop) repair facility