NDLI: Rehosting test program sets for legacy electronics: a test requirements-based approach

Content Provider	IEEE Xplore Digital Library
Author	Freschi, S. Barton, D. Bukata, E.
Copyright Year	1998
Description	Author affiliation: Intermetrics Inc., Vienna, VA, USA (Freschi, S.)
Abstract	The service lives of weapon systems and their electronic subsystems are being extended well beyond the affordable lives of the test equipment used to support them. The increasing commercial item content of these testers is shortening their product life cycles by increasing the frequency of obsolescence issues and the need for configuration changes. In addition, as the Department of Defense searches for ways to reduce the cost of operating and sustaining its aging tester infrastructure, the replacement of peculiar, obsolete testers with common, more efficient and cost-effective testers becomes an effective tactic. These factors all increase the probability that test programs for legacy electronics will need to be rehosted at least once during their service lives. This paper presents a test requirements-based approach to the design and verification of rehosted TPSs as a method to address these challenges. The approach will be to express test requirements, extracted from legacy TPSs and available product data, in a consistent information-based model, the Test Requirements Model (TeRM). This will, in turn, provide the TPS engineer with an objective and consistent basis for validating the rehosted TPS as a natural byproduct of the reengineering process. It will be shown that this approach can address TPS rehost challenges as well as extend to the reengineering of obsolete electronics. The service lives of weapon systems and their electronic subsystems are being extended well beyond the affordable lives of the test equipment used to support them. The increasing commercial item content in these testers is shortening their product life cycles and increasing the frequency of obsolescence issues and configuration changes. In addition, as the Department of Defense searches for ways to reduce the cost of operating and sustaining its aging infrastructure, replacing peculiar, obsolete testers with common, more cost effective and efficient testers becomes an effective tactic.
Starting Page	315
Ending Page	320
File Size	650525
Page Count	6
File Format	PDF
ISBN	0780344200
ISSN	10887725
DOI	10.1109/AUTEST.1998.713462
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-08-25
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Electronic equipment testing Costs Test equipment Weapons Life testing Frequency Aging Production facilities Investments Data mining
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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