NDLI: Serial replacement maintenance philosophies and multiple-failure diagnostic strategies: a marriage of multiple-fault integrity and common cause sensibility

Content Provider	IEEE Xplore Digital Library
Author	Gould, E.
Copyright Year	1997
Description	Author affiliation: DSI Int., Orange, CA, USA (Gould, E.)
Abstract	This paper discusses several methodological considerations associated with the incorporation of serial replacement maintenance philosophies into multiple-failure diagnostic strategies. If the serial replacement of items within isolated ambiguity groups is prioritized using isolation probabilities instead of failure probabilities then the resultant diagnostics are capable of exhibiting both the empirical common sense often attributed to single-fault isolation and the integrity and consistency inherent to multiple-failure diagnostics. Isolation probabilities may also be used to calculate the fault resolution statistics upon which many assessments of testability and diagnostic effectiveness are based. If is important, however, that multiple isolations be simulated for each combination of failed components, both in order to prevent the statistics from being skewed toward primary isolations and to allow the group sizes recorded for serially replaced components to properly reflect the topology of the device or system being diagnosed. The simulation of multiple isolations for each failure combination is also essential for the generation of accurate false removal predictions. Statistics based upon the serial replacement of fault groups isolated by a multiple-failure diagnostic strategy can allow design-phase assessments to more accurately predict the performance of fielded diagnostics, thereby allowing timely measures to be taken to reduce the overall cost of ownership.
Starting Page	446
Ending Page	454
File Size	882534
Page Count	9
File Format	PDF
ISBN	0780341627
DOI	10.1109/AUTEST.1997.633658
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1997-09-22
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Logic testing Probability Statistical analysis Power system modeling System testing Topology Predictive models Statistics Electrical resistance measurement Costs
Content Type	Text
Resource Type	Article

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