NDLI: VTest program mixed-signal virtual test approach

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VTest program mixed-signal virtual test approach

Content Provider	IEEE Xplore Digital Library
Author	Perkins, E.G. Wong, J.J.
Copyright Year	1997
Description	Author affiliation: Integr, Beaverton, OR, USA (Perkins, E.G.)
Abstract	The VTest (Virtual Test) Program is producing an open environment and a methodology for Virtual Test development of TPSs for mixed-signal PCBs/LRMs. The VTest effort is paving the way for the integration of Design and Test by providing an EDA-based system solution emphasizing Design for Test and the Re-Use of Design information in Test Development. The VTest solution incorporates the CAE/CAD/CAT software tools necessary for virtual test of digital, analog and mixed-signal technology PCBs/LRMs, as well as the tools and methodologies that support the use of automatic test program generation for multiple target testers. This paper discusses the VTest solution architecture and the VTest approach to mixed-signal TPS development.
Starting Page	60
Ending Page	71
File Size	982999
Page Count	12
File Format	PDF
ISBN	0780341627
DOI	10.1109/AUTEST.1997.633554
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1997-09-22
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing System testing Fixtures Signal design Automatic testing Software testing Life testing Design engineering Electronic mail Electronic equipment testing
Content Type	Text
Resource Type	Article

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