NDLI: A paperless system of reporting and analyzing field failure data for IFTE ATS

Content Provider	IEEE Xplore Digital Library
Author	Curry, P.A. Hauer, C.C. Jones, B.E.
Copyright Year	1997
Description	Author affiliation: USATA Eng., USA (Curry, P.A.)
Abstract	Data collection from complex systems is typically inefficient and inaccurate since it requires a certain degree of operator interaction. Sample Data Collection (SDC) is a well known method of collecting data in some government agencies. This can be a very cumbersome method requiring many man-hours and much dedication of the data collectors in filling out surveys. The US Army has developed a tool for its Integrated Family of Test Equipment (IFTE) which will replace this time and personnel intensive method with a real-time automated process which shall yield considerable cost savings and increase the accuracy of what is reported. Coupled with this reporting scheme are automated analyses, which are currently under development to satisfy the needs of the owners of the equipment under test. Benefits of this automation are numerous. Determining more accurate spares requirements, demonstrating/validating reliability, availability, and maintainability (RAM) values, and many more to be discussed. This automated approach is designed for the US Army's IFTE Automated Test Systems (ATS) which diagnoses and repairs its electronic military systems including, but not limited to, complex avionics, communications, combat, tracked vehicles, and missiles. There are no special requirements for computer equipment, as a 486 generation processor based personal computer is used currently with commercial software tools. This paper details the way the test data is automatically logged into electronic format, the system in place to collect this data, and possible ways to benefit from this technology using automated analyses-all paperless.
Starting Page	13
Ending Page	17
File Size	479727
Page Count	5
File Format	PDF
ISBN	0780341627
DOI	10.1109/AUTEST.1997.633541
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1997-09-22
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Data analysis Failure analysis Automatic testing Electronic equipment testing System testing Military computing Government Filling Test equipment Personnel
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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