NDLI: Predicting defects in disk drive manufacturing: A case study in high-dimensional classification

Content Provider	IEEE Xplore Digital Library
Author	Apte, C. Weiss, S. Grout, G.
Copyright Year	1993
Description	Author affiliation: IBM, Yorktown Heights, NY, USA (Apte, C.; Weiss, S.)
Abstract	The authors consider the application of several computationally intensive classification techniques to disk drive manufacturing quality control. This application is characterized by very high dimensions, with hundreds of features, and tens of thousands of cases. The efforts were directed toward a search for knowledge that would assist the engineers in providing another increment of performance to the already highly performing knowledge-based system. Two principal issues are addressed. The issues are whether a very expensive testing process can be eliminated while still maintaining high quality throughput in disk drive manufacturing, and whether the manufacturing process can be made more efficient by identifying bad disk drives prior to the expensive testing. Preliminary results indicate that although the expensive testing cannot be completely eliminated, a fraction of the disk drives can be determined to be faulty prior to further testing. This detection may improve the throughput of the manufacturing line.<>
Starting Page	212
Ending Page	218
File Size	564392
Page Count	7
File Format	PDF
ISBN	0818638400
DOI	10.1109/CAIA.1993.366608
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1993-03-01
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Disk drives Testing Throughput Manufacturing processes Computer aided manufacturing Computer applications Quality control Maintenance engineering Knowledge engineering Knowledge based systems
Content Type	Text
Resource Type	Article

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