NDLI: Extraction of Transistor Large Signal Models from Vector Nonlinear Network Analyzers

Content Provider	IEEE Xplore Digital Library
Author	Curras-Francos, M.C. Tasker, P.J. Fernandez-Barciela, M. Campos-Roca, Y. Sanchez, E.
Copyright Year	2000
Description	Author affiliation: University of Vigo, E.T.S.I. Telecomunicación, Campus Universitario, 36207, Vigo, Spain (Curras-Francos, M.C.; Fernandez-Barciela, M.; Campos-Roca, Y.; Sanchez, E.) \|\| University of Vigo, E.T.S.I. Telecomunicación, Campus Universitario, 36207, Vigo, Spain; Cardiff University, Cardiff School of Engineering, P.O. Box 689, Cardiff CF2 3TF, UK (Tasker, P.J.)
Abstract	A vector nonlinear network analyzer (VNNA) measurement system, based on the HP Microwave Transition Analyzer (MTA), has recently been developed. This system allows both two-port small signal S parameter measurements in the frequency domain and large signal waveform measurements in the time domain. This capability makes it an ideal tool to generate and verify nonlinear transistor models with a unique measurement system. Two different large signal model extraction approaches are presented in this paper utilizing exclusively the VNNA system. One is based on the classical indirect approach of using small signal measurements, and the other is based on the use of large signal waveform measurements.
Starting Page	1
Ending Page	5
File Size	160144
Page Count	5
File Format	PDF
ISBN	0780356861
DOI	10.1109/ARFTG.2000.327393
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-06-15
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Signal analysis Radio frequency Scattering parameters Microwave measurements Frequency measurement Time measurement Instruments Telecommunications Frequency domain analysis Microwave transistors
Content Type	Text
Resource Type	Article

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