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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Bygrave, F. Comyn, T.P. Bell, A.J. |
| Copyright Year | 2011 |
| Description | Author affiliation: Institute for Materials Research, University of Leeds, UK (Bygrave, F.; Comyn, T.P.; Bell, A.J.) |
| Abstract | BiFeO3-PbTiO3 films around the morphotropic phase boundary were deposited by pulsed laser deposition on polycrystalline Pt/TiOx/SiO2/Si substrates. X-ray analysis confirms that 0.6BiFeO3-0.4PbTiO3 films are (001) preferentially orientated upto 1 µm, due to lattice matching with the underlying silicon. The misfit strain at the substrate - film interface is relieved by an orientation transformation from (001) to (100). Above ∼220 nm the films become resistive and a piezoelectric response is demonstrated through PFM. A piezoeolectric response is not detected below ∼220 nm due to the presence of intermetallic phases present at the film - substrate interface. TEM EDX analysis confirms the destruction of the Pt bottom electrode with interdiffusion between the Bi and Pt. This paper discusses the structure of the films with changing film thickness, as well as interdiffusion between the Pt and Bi. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 1008243 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781457711626 |
| e-ISBN | 9781457711633 |
| e-ISBN | 9781457711619 |
| DOI | 10.1109/ISAF.2011.6014128 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-07-24 |
| Publisher Place | Canada |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Substrates Atomic measurements Films Iron Atomic layer deposition Thickness measurement Oxygen interdiffusion Pulsed laser deposition bismuth ferrite lead titanate thickness thin film |
| Content Type | Text |
| Resource Type | Article |
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