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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Hejazi, M. Safari, A. |
| Copyright Year | 2011 |
| Description | Author affiliation: Glenn Howatt Electroceramics Laboratory, Department of Materials Science and Engineering, Rutgers, The state University of New Jersey, Piscataway, 08854, USA (Hejazi, M.; Safari, A.) |
| Abstract | We have studied the effect of deposition parameters on the microstructure and ferroelectric properties of pulsed laser deposited 0.88(Bi0.5Na0.5)TiO3-0.08(Bi0.5K0.5)TiO3-0.04BaTiO3 thin films on SrRuO3 coated SrTiO3 substrates. The films were deposited at different repletion rates, substrate temperatures, and laser energies. It has been demonstrated that the film made at 800 °C, 10 Hz, 400 mtorr and 1.2 $J.cm^{−2}$ shows the best ferroelectric properties among the investigated films. The remnant polarization for this film was measured to be about 30 $µC.cm^{−2}.$ We have also discussed the electrical conduction mechanisms in the temperature range of 200–350 K. At low electric fields, the leakage mechanism is governed by the ohmic conduction. With increasing the applied filed, an abrupt increase in the leakage current was observed. This was attributed to a trap-filling process by the injected carries. At sufficiently high electric fields, the leakage current obeyed the Child's trap-free square law suggesting the space charge limited current was the dominant mechanism. |
| Starting Page | 1 |
| Ending Page | 3 |
| File Size | 274737 |
| Page Count | 3 |
| File Format | |
| ISBN | 9781457711626 |
| e-ISBN | 9781457711633 |
| e-ISBN | 9781457711619 |
| DOI | 10.1109/ISAF.2011.6014119 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-07-24 |
| Publisher Place | Canada |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Films Temperature measurement Leakage current Temperature Electric fields Pulsed laser deposition Substrates leakage curret lead-free ferroelectric thin film BNT pulsed laser deposition |
| Content Type | Text |
| Resource Type | Article |
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