NDLI: Direct-write of PZT thick films

Content Provider	IEEE Xplore Digital Library
Author	Allahverdi, M. Safari, A.
Copyright Year	2005
Description	Author affiliation: Dept. of Ceramic & Mater. Eng., Rutgers Univ., Piscataway, NJ, USA (Allahverdi, M.; Safari, A.)
Abstract	Lead zirconate titanate (PZT) thick films have been prepared on alumina substrates using a direct-write technology. Thick films of 50 to 200 /spl mu/m were deposited, dried and then sintered at 1000/spl deg/ to 1200/spl deg/C for 30 minutes in PbO-rich atmosphere. Comparison of the thick film properties revealed that the dielectric constant and remnant polarization of the films sintered at 1100/spl deg/C were maximum, likely due to a balance between densification and lead loss. The effects of three sintering aids, i.e., lead oxide, lithium bismuth oxide, and a borosilicate glass, have been investigated on the microstructure and electrical properties of the PZT thick films. It was observed that a 2 wt% lithium bismuth oxide additive has a positive effect on the dielectric constant and remnant polarization of the PZT thick films sintered at 1100/spl deg/C. The microstructures of the films revealed that 3 wt% additives would result in excessive shrinkage and formation of large pores and cracks at a sintering temperature of 1100/spl deg/C and above. PZT films with 2 wt.% lithium bismuth oxide showed improved dielectric constant (/spl sim/40-50%) and remanent polarization (/spl sim/65%) compared to additive-free PZT thick films. It was also found that the properties are strongly thickness dependent.
Starting Page	250
Ending Page	253
File Size	937731
Page Count	4
File Format	PDF
ISBN	0780384105
ISSN	10994734
DOI	10.1109/ISAF.2004.1418383
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-08-23
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Thick films Dielectric constant Polarization Lithium Bismuth Microstructure Additives Titanium compounds Dielectric substrates Lead
Content Type	Text
Resource Type	Article

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