NDLI: Magnetic Properties of Exchange-Biased <formula formulatype=inline><tex Notation=TeX>$[{rm Co/Pt}]_{rm n}$</tex></formula> Multilayer <newline/>With Perpendicular Magnetic Anisotropy

Content Provider	IEEE Xplore Digital Library
Author	Jun-Yang Chen Jia-Feng Feng Zhu Diao Gen Feng Coey, J.M.D. Xiu-Feng Han
Copyright Year	1965
Abstract	Perpendicular exchange-biased [Co/Pt]₃/Co(t_Co)/IrMn andIrMn/Co(t_Co)/Pt/[Co/Pt]₃ multilayers have been fabricated, changing the thickness (t_Co) of the cobalt that is next to the IrMn layer. The crystal structure, interface roughness and magnetic properties were characterized by X-ray diffraction (XRD), X-ray reflectivity (XRR), atomic force microscopy (AFM) and extraordinary Hall Effect (EHE). The multilayers are flat, and the roughness is about 0.2 nm across the 2-¿m scanning range. The magnetization reversal is dependent on t_Co, and the exchange bias and coercivity vary with t_Co. The exchange bias reaches a maximum value (about 13.9 mT) for top-pinned multilayers at t_Co = 0.45 nm, while it reaches a maximum (about 3.5 mT) for bottom-pinned multilayers at t_Co = 0.6 nm. For both stacks the coercivity is maximum (about 30 mT) at t_Co = 0.8 nm, and stable for t_Co > 1.0 nm. These results are well understood in terms of the Co spin orientation at the Co/IrMn interface.
Sponsorship	IEEE Magnetics Society
Starting Page	1401
Ending Page	1404
Page Count	4
File Size	451164
File Format	PDF
ISSN	00189464
Volume Number	46
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Magnetic properties Magnetic multilayers Atomic force microscopy Coercive force Cobalt X-ray diffraction X-ray scattering Reflectivity Atomic layer deposition Magnetic force microscopy magnetization reversal $[{\rm Co/Pt}]_{\rm n}$ perpendicular multilayers
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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