NDLI: A method for predicting missing-error counts at high recording densities

Content Provider	IEEE Xplore Digital Library
Author	Ogawa, K. Ogawa, S. Suenaga, T.
Copyright Year	1965
Abstract	This report describes a prediction method for the missing-error count at high recording densities by means of a simple analysis of error data at a low recording density. The decrease of a signal-peak amplitude is approximately in proportion to the volume ratio of a defect to one bit. Errors can be produced by extraordinary small defects as the recording density is in-ereased, while at lower recording density, errors from these defects can be detected only when the threshold level is set at a much higher level. Upon investigation of this effect the authors have found that the error-count at the higher densities can be predicted on the basis of measurements at low densities. Many experimental investigations were carried out to check the accuracy of the prediction method with a computer-aided disk test system. The predicted error count is in approximate agreement with the experimental resuls, and it is concluded that the prediction method is of considerable practical value.
Sponsorship	IEEE Magnetics Society
Starting Page	1193
Ending Page	1195
Page Count	3
File Size	284169
File Format	PDF
ISSN	00189464
Volume Number	13
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1977-09-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Virtual manufacturing Needles Gaussian distribution Shape Aluminum Signal detection Equations Density measurement
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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