NDLI: Topography control of plated wire memory elements

Content Provider	IEEE Xplore Digital Library
Author	Richards, H. Humpage, J. Hendy, J.
Copyright Year	1965
Abstract	The paper deals with the control of substrate topography to achieve the magnetic properties necessary for electroplated wire memory elements. A number of surface preparation techniques have been studied using control of the plating variables of deposited copper films. Scanning electron microscopy has made possible quantitative measurements of some of the surface topographies. It is shown that the domain wall coercive force of Permalloy films is related to the film thickness by an inverse 4/3 power law providing the films were above 2000 Å in thickness. Measurements made of the coercive force for constant thickness Permalloy films as a function of surface roughness showed that it is related to the frequency and amplitude of nodular growths and that there is a maximum at a particular nodular frequency. Using the data obtained, a choice of substrate and film thickness can be made to match the requirements of a particular memory element.
Sponsorship	IEEE Magnetics Society
Starting Page	351
Ending Page	355
Page Count	5
File Size	1076755
File Format	PDF
ISSN	00189464
Volume Number	4
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1968-09-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Wire Electric variables control Magnetic variables control Surface topography Substrates Coercive force Frequency Magnetic properties Copper Magnetic films
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Plated-wire technology: A critical review

Coercive-force measurements in plated wire

The NDRW-characteristic of a plated wire memory element with an interlayer of tin

Electrodeposited FePt films

Relationship of some processing variables to plated-wire memory properties

Laminated thin magnetic film memory elements

Control of coercive force of Co-Cr sputtered films

Disturb properties of exchange-coupled composite plated wires

High-resolution readout from magneto-optical read-only-memory

Topography control of plated wire memory elements

Similar Documents

Plated-wire technology: A critical review

Coercive-force measurements in plated wire

The NDRW-characteristic of a plated wire memory element with an interlayer of tin

Electrodeposited FePt films

Relationship of some processing variables to plated-wire memory properties

Laminated thin magnetic film memory elements

Control of coercive force of Co-Cr sputtered films

Disturb properties of exchange-coupled composite plated wires

High-resolution readout from magneto-optical read-only-memory

Topography control of plated wire memory elements