NDLI: Permalloy clad drawn wire for use in a semipermanent memory

Content Provider	IEEE Xplore Digital Library
Author	Odani, Y. Terajima, M. Fujisawa, K.
Copyright Year	1965
Abstract	Permalloy clad drawn wire, a new memory element for large-scale semipermanent memory, has been fabricated, and its pulse response measured. This wire is fabricated by a process in which a silver-copper alloy rod is put in a Permalloy tube, which is then drawn through dies. The Permalloy clad drawn wire described in this paper has a diameter of 0.1 mm and a Permalloy outer layer 3.5 microns thick. In the final annealing, which is the last step in fabrication of the wire, magnetic anisotropy caused by drawing in the longitudinal direction of the wire is erased. At the same time, a new anisotropy having its easy axis circumferential to the wire appears, if the Permalloy composition is chosen so that its magnetostriction is slightly negative. Permalloy clad drawn wire can be used in almost the same way as the magnet card twistor memory, except that the wire requires a small bias current. This bias current determines the direction of magnetization when the drive pulse is removed. For the wire described, a bias current of less than 30 mA is sufficient.
Sponsorship	IEEE Magnetics Society
Starting Page	356
Ending Page	359
Page Count	4
File Size	527253
File Format	PDF
ISSN	00189464
Volume Number	4
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1968-09-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Wire drawing Pulse measurements Magnetic anisotropy Magnetostriction Large-scale systems Annealing Fabrication Anisotropic magnetoresistance Perpendicular magnetic anisotropy Magnetization
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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Annealing effects in plated-wire memory elements, part I: Interdiffusion of copper and permalloy

Aging and stabilization of permalloy films

Current-induced domain-wall motion in U-shaped permalloy wire

Experimental evidence for radial dependence of induced anisotropy in cold drawn permalloy wires

Evaluation of aging in electrodeposited permalloy memory wire

Wall coupling in permalloy film pairs with large separations

Anisotropic stress in window-plated Permalloy thin films

Random anisotropy of crystallites in thin permalloy films

Induced uniaxial magnetic anisotropy and film magnetostriction in very thin permalloy films

Permalloy clad drawn wire for use in a semipermanent memory

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Annealing effects in plated-wire memory elements, part I: Interdiffusion of copper and permalloy

Aging and stabilization of permalloy films

Current-induced domain-wall motion in U-shaped permalloy wire

Experimental evidence for radial dependence of induced anisotropy in cold drawn permalloy wires

Evaluation of aging in electrodeposited permalloy memory wire

Wall coupling in permalloy film pairs with large separations

Anisotropic stress in window-plated Permalloy thin films

Random anisotropy of crystallites in thin permalloy films

Induced uniaxial magnetic anisotropy and film magnetostriction in very thin permalloy films

Permalloy clad drawn wire for use in a semipermanent memory