NDLI: Kerr effects in thin EuO films on mirror substrates

Content Provider	IEEE Xplore Digital Library
Author	Kie Ahn
Copyright Year	1965
Abstract	The Kerr magnetooptic effects in thin films of EuO were enhanced by closely matching the antireflection condition. This condition was met by controlling the thickness of semitransparent EuO films deposited on a mirror substrate. In the visible spectrum the longitudinal Kerr rotation 2φ is increased to about 8 degrees as compared with 2 degrees in single-crystal EuO. The transverse Kerr effect 2δ is also increased to about 0.8, the largest value yet reported. Corresponding to these maxima there is a minimum in reflectance that approaches the true antireflection condition. Details of the experiment and the semiautomated transverse Kerr effect plotter are presented with comparison of data from other magnetic films and enhancement techniques.
Sponsorship	IEEE Magnetics Society
Starting Page	408
Ending Page	411
Page Count	4
File Size	453571
File Format	PDF
ISSN	00189464
Volume Number	4
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1968-09-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Kerr effect Mirrors Optical films Reflectivity Nonlinear optics Substrates Magnetooptic effects Optical polarization Transistors Thickness control
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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