NDLI: Considerations for On-Wafer Millimeter-Wave Measurements on Thin Ceramic Substrate

Content Provider	IEEE Xplore Digital Library
Author	Hammou, D. Djerafi, T. Nedil, M. Tatu, S.O.
Copyright Year	1963
Abstract	This paper presents an on-wafer millimeter-wave circuit's characterization build on thin ceramic substrate having a high relative permittivity. An RF short circuit, designed with a quarter-wavelength radial stub, is used in load design and launch transition. To improve the design accuracy of electromagnetic (EM) tools, the dielectric constant of the ceramic substrate is extracted using measurements of several pairs of microstrip lines combined with EM simulations. The largest deviation obtained, compared with the mean value over the frequency band, is less than 1%. Thus, a new six-port circuit is designed and characterized using a millimeter-wave probe station. A comparison between the measurement and simulation results, using extracted manufacturer-recommended relative permittivity, is conducted. The six-port $q_{i}$ points' location is close to the simulated and theoretical ones over the frequency band of interest. As demonstrated in this paper, the substrate permittivity extraction has improved the design accuracy of the millimeter-wave circuits. Excellent performance of this circuit in terms of matching, isolation, and amplitude and phase balance is obtained.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	441
Ending Page	447
Page Count	7
File Size	1628753
File Format	PDF
ISSN	00189456
Volume Number	65
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2016-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Transmission line measurements Millimeter wave measurements Permittivity Substrates Permittivity measurement Microstrip Calibration transmission lines. Ceramics dielectric constant millimeter-wave integrated circuits millimeter-wave measurements parameter extraction scattering parameters transmission lines
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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