NDLI: Analytical transmission line model for complex dielectric constant measurement of thin substrates using T-resonator method

Content Provider	IET Digital Library
Author	Zahedi, Amir Boroumand, Farhad A. Aliakbrian, Hadi
Abstract	This work presents a new analytical transmission line model for microstrip T-resonator dielectric constant measurement method in order to simplify the extraction of the complex dielectric permittivity of the substrate and increase its accuracy. The proposed new formula, which is based on the T -matrix equivalent circuit of the structure, is only dependent on the propagation and attenuation constants of the stub line. Two new formulas to determine the end effect of open-ended stub and the propagation constant parameters are also presented. As an example, a T-resonator is implemented on a 31 mil RO4003C substrate, and it is simulated and measured S-parameter results in the range of 1 MHz–8 GHz are used to calculate a complex dielectric constant of the substrate at each resonance frequency. A full-wave simulation is also used to confirm the accuracy of the proposed model. The comparison between the simulated and the measured S-parameters demonstrates a relative error of <1% over the frequency range.
Starting Page	2027
Ending Page	2034
Page Count	8
ISSN	17518725
Volume Number	14
e-ISSN	17518733
Issue Number	Issue 15, Dec (2020)
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/iet-map/14/15
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/10.1049/iet-map.2019.1117
Journal	IET Microwaves, Antennas & Propagation
Publisher Date	2020-09-25
Access Restriction	Open
Rights Holder	© The Institution of Engineering and Technology
Subject Keyword	31 Mil RO4003C Substrate Analytical Transmission Line Model Attenuation Constants Complex Dielectric Constant Measurement Complex Dielectric Permittivity Dielectric Permittivity Dielectric Resonance Electrical Resonances Equivalent Circuit Frequency 1.0 MHz to 8.0 GHz Full-wave Simulation Measured S-Parameter Microstrip T-resonator Dielectric Constant Measurement Method Open-ended Stub Photonic Technology Propagation Constant Parameter Resonance Frequency S Parameter Stub Line T-matrix Equivalent Circuit Thin Substrates
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Complex dielectric permittivity extraction based on multilayer thin film microstrip lines

Equivalent circuit of an open-ended coaxial line in a lossy dielectric

Suspended Ring Resonator for Dielectric Constant Measurement of Foams

A Review of Microstrip T-Resonator Method in Determining the Dielectric Properties of Printed Circuit Board Materials

A tunable split resonator method for nondestructive permittivity characterization

Two differential open resonator techniques for measuring dielectric constants of thin films on substrates

Measurement of Dielectic Properties of Biological Substances Using Improved Open-Ended Coaxial Line Resonator Method

Losses of the Parallel-Plate Dielectric Resonator

Broadband complex permittivity measurements of dielectric substrates using a split-cylinder resonator

Analytical transmission line model for complex dielectric constant measurement of thin substrates using T-resonator method

Similar Documents

Complex dielectric permittivity extraction based on multilayer thin film microstrip lines

Equivalent circuit of an open-ended coaxial line in a lossy dielectric

Suspended Ring Resonator for Dielectric Constant Measurement of Foams

A Review of Microstrip T-Resonator Method in Determining the Dielectric Properties of Printed Circuit Board Materials

A tunable split resonator method for nondestructive permittivity characterization

Two differential open resonator techniques for measuring dielectric constants of thin films on substrates

Measurement of Dielectic Properties of Biological Substances Using Improved Open-Ended Coaxial Line Resonator Method

Losses of the Parallel-Plate Dielectric Resonator

Broadband complex permittivity measurements of dielectric substrates using a split-cylinder resonator

Analytical transmission line model for complex dielectric constant measurement of thin substrates using T-resonator method