NDLI: Predicting Statistical Characteristics of Jitter Due to Simultaneous Switching Noise

Content Provider	IEEE Xplore Digital Library
Author	Sui, C. Ren, L. Gao, X. Pan, J. Drewniak, J.L. Beetner, D.G.
Copyright Year	1964
Abstract	Switching of logic gates is often responsible for significant power supply noise. Predicting the jitter resulting from the power supply noise can be critical to analyze the proper operation of high-speed devices. The statistical characteristics of jitter, such as the mean standard deviation of jitter, can be used to place a meaningful bound on the worst-case timing margin and to estimate the bit error rate. While the statistical characteristics of the noise can be found through simulations of many input logic vectors, such simulations require significant computational effort and require methods for choosing suitable data vectors. Vectorless methods allow rapid analysis of switching without using predefined input data and can be used to understand which portions of the logic circuit contribute most to the noise. In this paper, methods using vectorless techniques are presented to predict the mean and standard deviation of the power supply noise on the printed circuit board (PCB), and the mean and standard deviation of the resulting peak-to-peak jitter in a driver on the same PCB. In experiments, the techniques were able to predict the average and standard deviation of the peak power supply noise on the PCB with 2% and 8% error, respectively, and of the peak-to-peak jitter with 21% error, which is sufficient for predicting how a specific logic design might impact jitter, and for proposing means to minimize that impact.
Sponsorship	IEEE Electromagnetic Compatibility Society
Starting Page	249
Ending Page	256
Page Count	8
File Size	1103376
File Format	PDF
ISSN	00189375
Volume Number	58
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2016-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Switches Clocks Jitter Power supplies Logic gates Integrated circuit modeling Standards statistical analysis Analytical models field programmable logic array integrated circuit (IC) noise jitter noise measurement power distribution
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics Condensed Matter Physics Electrical and Electronic Engineering

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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