NDLI: Estimation of Non-Idealities in Sigma-Delta Modulators for Test and Correction Using Unscented Kalman Filters

Content Provider	IEEE Xplore Digital Library
Author	Lorenz, M. Ritter, R. Anders, J. Ortmanns, M.
Copyright Year	2004
Abstract	In this paper, an enhanced unscented Kalman filter is used for the estimation of non-idealities in sigma-delta modulators. As sigma-delta modulator based analog-to-digital converters are known to be prone to performance degradation from many circuit non-idealities, testing and selection of the manufactured chips as well as post-correction procedures are required to ensure a reliable performance. In contrast to most state-of-the art techniques, the proposed estimator is capable of simultaneously tracking a large set of non-ideal parameters with high accuracy and in a very short offline time within the range of microseconds. Three possible implementations are proposed and it is shown how the technique is used to perform an in situ non-ideality estimation and subsequent calibration of a manufactured chip, bringing the modulator back into its designed performance range. It is further demonstrated that the estimator can reliably detect the non-idealities over a wide range when intentionally degrading the performance of the chip by manually sweeping its trimming parameters. The presented hardware measurement results prove that the proposed technique is practically applicable to the test and/or calibration of sigma-delta data converters.
Sponsorship	IEEE Circuits and Systems Society
Starting Page	1240
Ending Page	1249
Page Count	10
File Size	2136827
File Format	PDF
ISSN	15498328
Volume Number	62
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Modulation Estimation Mathematical model Testing Sigma-delta modulation Kalman filters Reliability testing Circuit testing delta sigma modulation error analysis error correction self-testing sigma delta modulation
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Hardware and Architecture

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