NDLI: A Primary-Auxiliary Temperature Sensing Scheme for Multiple Hotspots in System-on-a-Chips

Content Provider	IEEE Xplore Digital Library
Author	Peng-Yu Chen Guan-Ying Huang Ya-Ting Shyu Soon-Jyh Chang
Copyright Year	2001
Abstract	A primary-auxiliary temperature sensing scheme for system-on-a-chip application is proposed in this paper. Taking advantage of the high accuracy and linearity of the analog primary temperature sensors and low production cost of the digital auxiliary temperature sensors, this sensing scheme monitors multiple hotspots in a highly integrated system chip with small area and low power. A cost efficient calibration strategy based on the difference of calibration complexity and sensitivity to the MOSFET aging between the primary and auxiliary temperature sensors is also presented in this paper. Both the temperature sensor prototypes are designed and fabricated with a 90-nm CMOS process technology. The core area of the primary/auxiliary temperature sensors is 0.039/0.001 mm², and consumed energy per conversion is 20.06/0.136 nJ/S with a 1 V supply voltage and 100-kS/s conversion rate. The performance of the temperature sensors and the accuracy improvement of the proposed calibration method are proved with the measurement results.
Sponsorship	IEEE Sensors Council
Starting Page	2633
Ending Page	2642
Page Count	10
File Size	2689971
File Format	PDF
ISSN	1530437X
Volume Number	14
Issue Number	8
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature sensors Calibration Temperature measurement Accuracy Capacitors System-on-chip MOSFET aging Multiple hotspots SAR ADC primary auxiliary temperature sensing
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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