NDLI: Correlations Between Mapping Spectroscopic Ellipsometry Results and Solar Cell Performance for Evaluations of Nonuniformity in Thin-Film Silicon Photovoltaics

Content Provider	IEEE Xplore Digital Library
Author	Dahal, L.R. Zhiquan Huang Attygalle, D. Salupo, C. Marsillac, S. Podraza, N.J. Collins, R.W.
Copyright Year	2011
Abstract	An understanding of the relationship between materials property and thin-film solar cell performance variations over large areas is of interest for evaluating the impact of macroscopic nonuniformities in scale-up from laboratory cells to production modules. In this study, we have spatially correlated the properties of the hydrogenated silicon (Si:H) i- and p-layers-as mapped over a 13 cm×13 cm substrate area-with device performance parameters from an array of a-Si:H based n-i-p dot cells. To evaluate materials and device nonuniformities, a 16 × 16 array of dot cells has been fabricated over the substrate area, and this same area has been mapped by spectroscopic ellipsometry (SE).Analysis of the SE data over the full area provides maps of i-layer thickness and band gap, p-layer thickness and band gap, and p-layer surface roughness thickness for the n-i-p solar cell structure. The mapped values adjacent to the devices have been correlated with photovoltaic (PV) device performance parameters. When sufficient nonuniformity exists, these correlations enable optimization based on specific values of the fundamental properties. Alternatively, if the optimum set of properties has been identified, the impact of deviations due to macroscopic uniformities can be evaluated.
Starting Page	387
Ending Page	393
Page Count	7
File Size	1237219
File Format	PDF
ISSN	21563381
Volume Number	3
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Photovoltaic cells Photonic band gap Correlation Performance evaluation Rough surfaces Surface roughness Photovoltaic systems silicon Amorphous semiconductors ellipsometry hydrogen nanocrystals photovoltaic (PV) cells
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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