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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Harpe, P. Cantatore, E. van Roermund, A. |
| Copyright Year | 1966 |
| Abstract | This paper presents a power-efficient 10/12 bit 40 kS/s SAR ADC for sensor applications. It supports resolutions of 10 and 12 bit and sample rates from DC up to 40 kS/s to accommodate a variety of sensor applications. A Data-Driven Noise-Reduction method is introduced to selectively enhance the comparator noise performance. In this way, a higher ADC resolution can be achieved with a small increase of the power consumption. A self-oscillating comparator is used to generate the bit-cycling clock internally. In this way, the ADC only requires an external clock at the sample-rate frequency. A segmented capacitive DAC with 250 aF unit elements is applied to save power and to reduce DNL errors at the same time. The implemented prototype in 65 nm CMOS occupies an area of 0.076 mm 2. For the two supported resolutions (10/12 bit), the ADC achieves an ENOB of 9.4 and 10.1 bit while consuming 72 and 97 nW from a 0.6 V supply at 40 kS/s. This leads to power efficiencies of 2.7 and 2.2 fJ/conversion-step for 10 bit and 12 bit resolution, respectively. Furthermore, the leakage power, which is below 0.4 nW, ensures that the efficiency can be maintained down to very low sample rates. |
| Sponsorship | IEEE Solid-State Circuits Society IEEE Electron Devices Society IEEE Circuits and Systems Society Japan Society of Applied Physics (JSAP) IEEE Microwave Theory and Techniques Society IEEE San Francisco Section Bay Area Council Univ. PA IEEE |
| Starting Page | 3011 |
| Ending Page | 3018 |
| Page Count | 8 |
| File Size | 1014698 |
| File Format | |
| ISSN | 00189200 |
| Volume Number | 48 |
| Issue Number | 12 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-01-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Noise Clocks Noise reduction Power demand Capacitors Error probability Delays majority voting ADC analog-to-digital conversion CMOS successive approximation noise reduction comparator |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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