NDLI: Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Radiation Environments, Physical Mechanisms, and Foundations for Hardness Assurance

Content Provider	IEEE Xplore Digital Library
Author	Schwank, J.R. Shaneyfelt, M.R. Dodd, P.E.
Copyright Year	1963
Abstract	This document describes the radiation environments, physical mechanisms, and test philosophies that underpin radiation hardness assurance test methodologies. The natural space radiation environment is presented, including the contributions of both trapped and transient particles. The effects of shielding on radiation environments are briefly discussed. Laboratory radiation sources used to simulate radiation environments are covered, including how to choose appropriate sources to mimic environments of interest. The fundamental interactions of radiation with materials via direct and indirect ionization are summarized. Some general test considerations are covered, followed by in-depth discussions of physical mechanisms and issues for total dose and single-event effects testing. The purpose of this document is to describe why the test protocols we use are constructed the way they are. In other words, to answer the question: “Why do we test it that way”?
Sponsorship	IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD
Starting Page	2074
Ending Page	2100
Page Count	27
File Size	1905644
File Format	PDF
ISSN	00189499
Volume Number	60
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Protons Earth Ions Space vehicles Materials Laboratories total ionizing dose Enhanced low dose rate sensitivity hardness assurance interaction of radiation with materials preirradiation elevated temperature stress single-event effects single-event gate burnout single-event gate latchup single-event gate rupture single-event upset space radiation environment
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering

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Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Test Guideline for Proton and Heavy Ion Single-Event Effects

Test Procedures for Proton-Induced Single Event Latchup in Space Environments

Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits

Hardness Assurance Test Guideline for Qualifying Devices for Use in Proton Environments

Total Ionizing Dose and Single Event Effects Hardness Assurance Qualification Issues for Microelectronics

Heavy Ion Energy Effects in CMOS SRAMs

Effects of Angle of Incidence on Proton and Neutron-Induced Single-Event Latchup

Current and Future Challenges in Radiation Effects on CMOS Electronics

Improving Integrated Circuit Performance Through the Application of Hardness-by-Design Methodology

Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Radiation Environments, Physical Mechanisms, and Foundations for Hardness Assurance

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Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Test Guideline for Proton and Heavy Ion Single-Event Effects

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Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits

Hardness Assurance Test Guideline for Qualifying Devices for Use in Proton Environments

Total Ionizing Dose and Single Event Effects Hardness Assurance Qualification Issues for Microelectronics

Heavy Ion Energy Effects in CMOS SRAMs

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Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Radiation Environments, Physical Mechanisms, and Foundations for Hardness Assurance