NDLI: A Low-Cost Built-In Redundancy-Analysis Scheme for Word-Oriented RAMs With 2-D Redundancy

Content Provider	IEEE Xplore Digital Library
Author	Tsu-Wei Tseng Jin-Fu Li
Copyright Year	1993
Abstract	Built-in self-repair (BISR) techniques are widely used for repairing embedded random access memories (RAMs). One key component of a BISR module is the built-in redundancy-analysis (BIRA) design. This paper presents an effective BIRA scheme which executes the 2-D redundancy allocation based on a 1-D local bitmap. Two BIRA algorithms for supporting two different redundancy organizations are also proposed. Simulation results show that the proposed BIRA scheme can provide high repair rate (i.e., the ratio of the number of repaired memories to the number of defective memories) for the RAMs with different fault distributions. Experimental results show that the hardware overhead of the BIRA design is only about 2.9% for an 8192 × 64-bit RAM with two spare rows and two spare columns. Also, the ratio of the BIRA analysis time to the test time is only about 0.02% if the March-CW test is performed. Furthermore, a simulation flow is proposed to determine the size of the 1-D local bitmap such that the BIRA algorithm can provide the best repair rate using the smallest-size 1-D local bitmap.
Sponsorship	IEEE Computer Society Association for Computing Machinery (ACM)/SIGDA IEEE Computer Society Technical Committee on Design Automation
Starting Page	1983
Ending Page	1995
Page Count	13
File Size	1195606
File Format	PDF
ISSN	10638210
Volume Number	19
Issue Number	11
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-11-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Random access memory Circuit faults Redundancy Algorithm design and analysis Maintenance engineering Built-in self-test Resource management redundancy Built-in redundancy-analysis (BIRA) built-in self-repair (BISR) local bitmap RAMs
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Software Hardware and Architecture

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