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Content Provider | IEEE Xplore Digital Library |
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Author | Chien-I Kuo Heng-Tung Hsu Yu-Lin Chen Chien-Ying Wu Chang, E.Y. Miyamoto, Y. Wen-Chung Tsern Sahoo, K.C. |
Copyright Year | 1980 |
Abstract | High-performance metamorphic high-electron mobility transistors (MHEMTs) using an (InxGa1-xAs)m/(InAs)n superlattice structure as a channel layer have been fabricated successfully. These HEMTs with 80-nm gate length exhibited a high drain current density of 392 mA/mm and a transconductance of 991 mS/mm at 1.2-V drain bias. Compared with a regular In_xGa_1 - xAs channel, the superlattice-channel HEMTs showed an outstanding performance due to the high electron mobility and better carrier confinement in the (InxGa1-xAs)m/(InAs)n channel layer. When biased at 1.2 V, the current gain cutoff frequency (fT) and the maximum oscillation frequency (fmax) were extracted to be 304 and 162 GHz, respectively. As for noise performance, the device demonstrated a 0.75-dB minimum noise figure (NFmin) with an associated gain of 9.6 dB at 16 GHz. Such superior performance has made the devices with a superlattice channel well suitable for millimeter-wave applications. |
Sponsorship | IEEE Electron Devices Society |
Starting Page | 677 |
Ending Page | 679 |
Page Count | 3 |
File Size | 458831 |
File Format | |
ISSN | 07413106 |
Volume Number | 31 |
Issue Number | 7 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2010-07-01 |
Publisher Place | U.S.A. |
Access Restriction | One Nation One Subscription (ONOS) |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Radio frequency HEMTs MODFETs Superlattices Cutoff frequency Noise figure mHEMTs Current density Transconductance Electron mobility superlattice channel High-electron mobility transistors (HEMTs) InAs InGaAs |
Content Type | Text |
Resource Type | Article |
Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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