NDLI: Variability Driven Gate Sizing for Binning Yield Optimization

Content Provider	IEEE Xplore Digital Library
Author	Davoodi, A. Srivastava, A.
Copyright Year	1993
Abstract	High performance applications are highly affected by process variations due to considerable spread in their expected frequencies after fabrication. Typically ldquobinningrdquo is applied to those chips that are not meeting their performance requirement after fabrication. Using binning, such failing chips are sold at a loss (e.g., proportional to the degree that they are failing their performance requirement). This paper discusses a gate-sizing algorithm to minimize ldquoyield-lossrdquo associated with binning. We propose a binning yield-loss function as a suitable objective to be minimized. We show this objective is convex with respect to the size variables and consequently can be optimally and efficiently solved. These contributions are yet made without making any specific assumptions about the sources of variability or how they are modeled. We show computation of the binning yield-loss can be done via any desired statistical static timing analysis (SSTA) tool. The proposed technique is compared with a recently proposed sensitivity-based statistical sizer, a deterministic sizer with worst-case variability estimate, and a deterministic sizer with relaxed area constraint. We show consistent improvement compared to the sensitivity-based approach in quality of solution (final binning yield-loss value) as well as huge run-time gain. Moreover, we show that a deterministic sizer with a relaxed area constraint will also result in reasonably good binning yield-loss values for the extra area overhead.
Sponsorship	IEEE Computer Society Association for Computing Machinery (ACM)/SIGDA IEEE Computer Society Technical Committee on Design Automation
Starting Page	683
Ending Page	692
Page Count	10
File Size	526275
File Format	PDF
ISSN	10638210
Volume Number	16
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fabrication Frequency Performance loss Timing Microprocessors Mathematical programming Mathematical model Uncertainty Runtime Integrated circuit interconnections variability Circuit optimization convexity gate sizing
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Software Hardware and Architecture

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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Variability Driven Gate Sizing for Binning Yield Optimization

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