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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Vasudevan, D.P. Lala, P.K. Parkerson, J.P. |
| Copyright Year | 2004 |
| Abstract | Carry-select adders are one of the faster types of adders. This paper proposes a scheme that encodes the sum bits using two-rail codes; the encoded sum bits are then checked by self-checking checkers. The multiplexers used in the adder are also totally self-checking. The scheme is illustrated with the implementation of a 2-bit carry select adder that can detect all single stuck-at faults on-line; the detection of double faults is not guaranteed. Adders of arbitrary size can be constructed by cascading the appropriate number of such 2-bit adders. A range of adders from 4 to 128 bits is designed using this approach employing a 0.5-mum CMOS technology. The transistor overhead in implementing these self-checking adders varies from 19.51% to 20.94%, and the area overhead varies from 16.07% to 20.67% compared to adders without built-in self-checking capability. |
| Sponsorship | IEEE Circuits and Systems Society |
| Starting Page | 2696 |
| Ending Page | 2705 |
| Page Count | 10 |
| File Size | 2308380 |
| File Format | |
| ISSN | 15498328 |
| Volume Number | 54 |
| Issue Number | 12 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-12-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Encoding Adders Fault detection Circuit faults Multiplexing Electrical fault detection CMOS technology Very large scale integration Arithmetic Delay two-rail code On-line fault detection self-checking checker transient faults on-line fault detection |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering Hardware and Architecture |
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