NDLI: Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies

Content Provider	IEEE Xplore Digital Library
Author	Badaroglu, M. Donnay, S. De Man, H.J. Zinzius, Y.A. Gielen, G.G.E. Sansen, W. Fonden, T. Signell, S.
Copyright Year	1966
Abstract	Substrate noise is a major obstacle for mixed-signal integration. While the power consumption scales linearly with the clock frequency, substrate noise does not have this scaling due to the resonances in the transfer function of the supply current to the substrate. This paper addresses a practical technique to estimate the substrate noise frequency spectrum of a large mixed-mode System-on-Chip (SoC) with multiple supplies and embedded memories. The results have been verified with substrate noise measurements on a 60-MHz 220-Kgates telecom SoC implemented in a 0.35 /spl mu/m CMOS process on an EPI-type substrate. We compute a linear chip-level substrate model together with the single-cycle representation of piecewise-linear noise sources of three supply regions used in this ASIC. Based on this model we accurately estimate the four major resonances in the substrate noise spectrum and their relative magnitudes with 2 dB relative error at the major resonance with respect to measurements. We also present substrate noise measurements at different operating modes of the WLAN receiver. These measurements show that output I/O buffers generate significant substrate noise where an increase of 44% is measured for substrate noise peak-to-peak value due to the additional simultaneous switching of six output I/O buffers with already fully switching datapath and two output I/Os.
Sponsorship	IEEE Solid-State Circuits Society IEEE Electron Devices Society IEEE Circuits and Systems Society Japan Society of Applied Physics (JSAP) IEEE Microwave Theory and Techniques Society IEEE San Francisco Section Bay Area Council Univ. PA IEEE
Starting Page	1250
Ending Page	1260
Page Count	11
File Size	824319
File Format	PDF
ISSN	00189200
Volume Number	38
Issue Number	7
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-07-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Noise generators Wireless LAN System-on-a-chip Noise measurement Resonance Frequency estimation Semiconductor device modeling Power system modeling Energy consumption Clocks
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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