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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | June Lee Heung-Soo Im Dae-Seok Byeon Kyeong-Han Lee Dong-Hyuk Chae Kyong-Hwa Lee Sang Won Hwang Sung-Soo Lee Young-Ho Lim Jae-Duk Lee Jung-Dal Choi Young-Il Seo Jong-Sik Lee Kang-Deog Suh |
| Copyright Year | 1966 |
| Abstract | A 1.8-V, 1-Gb NAND flash memory is fabricated with 0.12-/spl mu/m CMOS STI process technology. For higher integration, a 32-cell NAND structure, which enables row decoder layout in one block pitch, is applied for the first time. Resulting cell and die sizes are 0.076 /spl mu/m/sup 2/ and 129.6 mm/sup 2/, respectively. A pseudo-4-phase charge pump circuit can generate up to 20 V even under the supply voltage of 1.6 V. A newly applied cache program function and expanded page size of (2 k + 64) byte lead to program throughput of 7 MB/s. The page copy-back function is provided for on-chip garbage collection. The read throughput of 27 MB/s is achieved by simply expanding I/O width and page size. A measured disturbance free-window of 3.5 V at 1.5 V-V/sub DD/ is obtained. |
| Sponsorship | IEEE Solid-State Circuits Society IEEE Electron Devices Society IEEE Circuits and Systems Society Japan Society of Applied Physics (JSAP) IEEE Microwave Theory and Techniques Society IEEE San Francisco Section Bay Area Council Univ. PA IEEE |
| Starting Page | 1502 |
| Ending Page | 1509 |
| Page Count | 8 |
| File Size | 713626 |
| File Format | |
| ISSN | 00189200 |
| Volume Number | 37 |
| Issue Number | 11 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2002-11-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | CMOS technology Charge pumps Throughput CMOS process Decoding Nonvolatile memory Image storage Voltage Integrated circuit measurements CMOS memory circuits |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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