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| Content Provider | IEEE Xplore Digital Library | 
|---|---|
| Author | Hong-Fwu Yu Chih-Hua Chiao | 
| Copyright Year | 1963 | 
| Abstract | In conducting a design-of-experiments, with degradation data, to improve the reliability of highly reliable products, one of the most important topics for manufacturers is to identify important factors that affect the product reliability. Several decision variables such as inspection frequency, sample size, and termination time at each run, do influence the precision of identifying the important factors and the experimental cost. This paper proposes a systematic approach to the identification problem with respect to fractional factorial degradation experiments. First, an intuitively appealing identification rule is proposed. Next, the optimum test plan is derived using the criterion of minimizing the total experimental cost. The inspection frequency, sample size, and termination time at each run, that are needed by this identification rule are computed by solving a nonlinear integer programming model with a minimum probability of correct selection. A simulation study investigates the efficiency of this method. | 
| Sponsorship | IEEE Reliability Society | 
| Starting Page | 427 | 
| Ending Page | 433 | 
| Page Count | 7 | 
| File Size | 550222 | 
| File Format | |
| ISSN | 00189529 | 
| Volume Number | 51 | 
| Issue Number | 4 | 
| Language | English | 
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) | 
| Publisher Date | 2002-12-01 | 
| Publisher Place | U.S.A. | 
| Access Restriction | One Nation One Subscription (ONOS) | 
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) | 
| Subject Keyword | Degradation Inspection Cost function Time measurement Frequency estimation Life testing Manufacturing Life estimation Light emitting diodes Stress measurement | 
| Content Type | Text | 
| Resource Type | Article | 
| Subject | Safety, Risk, Reliability and Quality Electrical and Electronic Engineering | 
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